Nanopositioning for Microscopy

Fast – Compact – To the Nanometer

Precision positioning is the key element in all types of microscopy. High-resolution microscopy must be capable of accurate and reproducible positioning of imaging elements and samples. Requirements range from Z focus positioning of the objective to coarse and fine positioning of the sample in X, Y, and Z direction as well as often in θX and θY direction and sometimes even in θZ. PI meets these requirements with a broad product portfolio for inverse microscope systems of all major manufacturers.

Coarse and Fine Positioning Sample Stages

U-780 PILine® XY Stage System with Controller and Joystick

High-resolution piezo linear drive
Self-locking at rest | Low noise
Highest stability due to low thermal load and no lubricants
Large dynamics range of 10 µm/s to 120 mm/s
Travel range to 135 mm x 85 mm
Compatible with a wide range of sample holders

Large selection of fine positioning stages for positioning of samples (sample holders) in the nanometer range

Positioning with (sub)nanometer precision in one (Z) direction or in many DOFs; depending on the model and requirements
Wide variety of travel ranges and speed

PIFOC® Objective Scanners: Focusing and Z-Stack Scanning with Nanometer Precision

With a wide range of PIFOC® lens scanners, PI provides the ability to do just the experiment / sample analysis you want to perform.
Latest developments comprise the newly designed PIFOC® P-725.1CDE2 with improved settling times.

Business Development Manager Rolf Ellerbrock explains the advantages of the motion solution

Further Applications

Applications for the Sample Positioning Stages

Microscopy: Super Resolution Microscopy | 3D Surface inspection | Digital slide scanning | SEM/AFM

Further Applications for the PIFOC® Scanner

Electronics manufacturing: Screening | Autofocus systems | Surface analysis | Metrology

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info@nanodunya.com.tr