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Products PI - Nanopositioning Piezo Flexure Stages PIFOC® Objective & PInano® Sample Scanners for Microscopy

PIFOC® Objective & PInano® Sample Scanners for Microscopy / Piezo-Z Stages and Piezo Z-Tip-Tilt Platforms with Nanometer Precision

The PIFOC® and PInano® series of piezo flexure stages and objective scanners provide high dynamics for positioning and scanning activities. Standard devices are available with well-suited solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective. Stages are readily available in a system along with the controller, all necessary connecting wires, and software. Flexure guides and frictionless motion amplifiers are used in these high resolution piezo-Z stages, tip-tilt stages, and Z-tip-tilt platforms to give expanded motion ranges and outstanding guiding precision.There are options for tip-tilt ranges of 4 milliradian and vertical travel ranges of several hundred meters.Piezo stages with flexures are capable of sub-nanometer-level linear and nanoradian-level rotary resolutions. Applications

PIFOC® Objective Scanners for Microscopy

P-725.4CDE2 with objective (not included in the scope of delivery) P-725.xCDE2 PIFOC Focus Scanner for Microscope Objectives Dynamic Scanning with Travel Ranges of 100 µm, 400 µm, or 800 µm
P-726 PIFOC High-Load Focus Scanner Highly Dynamic Focus Scanner with Long Travel Range for Heavy Objectives
V-308 Voice Coil PIFOC Focus Drive for Objectives High-dynamics positioner for microscope objectives
ND72Z2LAQ PIFOC Objective Scanning System 2000 µm Nanometer Resolution and Fast Step-and-Settle
P-725.CDD PIFOC High Dynamics Piezo Scanner Nanopositioner and Scanner for Microscope Objectives

Vertical Sample Stages for Microscopy

P-737 PIFOC Specimen Z Positioners With Large Aperture and Low Profile
P-736 PInano® Z Microscope Scanner Inexpensive, with Low Profile

PInano® Piezo Flexure XY(Z) Scanners

P-545.xR8S PInano® XY(Z) Piezo System Inexpensive Nanopositioning System for High-Resolution Microscopy
P-545.xC8S PInano® Cap XY(Z) Piezo System Capacitive Position Measuring for Super-Resolution Microscopy
P-545.3D8S PInano® Trak Piezo Tracking System Fast XY(Z) Stage for High Dynamics Microscopy
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Nano Dünya Mak. San. Tic. Ltd. Şti.
Parseller Mah. Gündoğan Sok. No:8/A
Ümraniye/İstanbul
 02166140039
 info@nanodunya.com.tr
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